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Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Methods used to determine peak intensities and information required when reporting results
Pages:
Publication date: 2011-11-01
Surface chemical analysis - Auger electron spectroscopy - Reporting of methods used for charge control and charge correction
Publication date: 2010-02-15
Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Determination of lateral resolution
Publication date: 2006-11-01
Publication date: 2006-07-01
Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
Pages: 23
Publication date: 2004-05-15
Surface chemical analysis - X-ray photoelectron spectroscopy - Reporting of methods used for charge control and charge correction
Pages: 11
Publication date: 2004-05-01